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High-Resolution Imaging of Coga/GaAs and Eras/GaAs Interfaces
Published online by Cambridge University Press: 25 February 2011
Abstract
CoGa/GaAs and ErAs/GaAs grown by molecular-beam epitaxy have been studied using high-resolution transmission electron microscopy (HRTEM). The epitactic interfaces have been shown to be abrupt on the atomic scale. Computer simulations of the HRTEM images have been obtained for different interface structures under various specimen and image conditions. Practical problems in the comparison between the simulated and experimental images are discussed.
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- Copyright © Materials Research Society 1990