Hostname: page-component-5c6d5d7d68-7tdvq Total loading time: 0 Render date: 2024-08-18T09:16:59.917Z Has data issue: false hasContentIssue false
  • English
  • Français

Influence of Device Configuration on External Quantum Efficiency in Organic Light-Emitting Devices

Published online by Cambridge University Press:  21 March 2011

Masayuki Yahiro  and
Tetsuo Tsutsui
Masayuki Yahiro
Affiliation:
Department of Applied Science for Electronics and Materials, Graduate School of Engineering Sciences, Kyushu University 6-1 Kasuga-koen, Kasuga, Fukuoka, 816-8580, Japan
Tetsuo Tsutsui
Affiliation:
Department of Applied Science for Electronics and Materials, Graduate School of Engineering Sciences, Kyushu University 6-1 Kasuga-koen, Kasuga, Fukuoka, 816-8580, Japan
Get access

Abstract

The external quantum efficiency in conventional double-layer type organic light-emitting devices with different layer thickness was carefully evaluated. From the measurements of luminance and emission spectra, external quantum efficiency (uncorrected) was obtained.

The correction due to the modification of spatial emission distribution was added from the measurements of spatial emission patterns. The external quantum efficiency, both uncorrected and corrected, showed strong dependency on the distance between a metal electrode and an emissive region. This variation was ascribed to the change of coupling-out efficiency. Independent experimental evaluations of apparent couple-out efficiency using an integrating sphere supported this interpretation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 660: Symposia JJ – Organic Electronic & Photonic Materials and Devices , 2000 , JJ5.27
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Baldo, M.A., Lamansky, S., Burrows, P.E., Tompson, M.E., Forrest, S.R., Appl. Phys. Lett. 75, 4 (1999).Google Scholar
2. Tsutsui, T., Yang, M., Yahiro, M., Nakamura, K., Watanabe, T., Tsuji, T., Fukuda, Y., Wakimoto, T., Miyaguchi, S., Jpn. J. Appl. Phys. part 2 38, L1502 (1999).Google Scholar
3. Kim, J., Ho, P.K.H., Greenham, N.C., and Friend, R.H., J. App. Phys. 88, 1073 (2000).Google Scholar
4. Madigan, C.F., Lu, M.H., Sturm, J.C., Appl. Phys. Lett. 76, 1650 (2000).Google Scholar
5. Bulovic, V., Khalfin, V.B., Gu, G., and Burrows, P.E., Phys. Rev. B. 58, 3730 (1998).Google Scholar
6. Greenham, N.C., Friend, R.H. and Bradlay, D.D.C., Adv. Mater. 6, 491 (1994).Google Scholar
7. Fukuda, Y., Watanabe, T., Wakimoto, T., Miyaguchi, S., Tsuchida, M., Synth. Met. 111–112, 1 (2000).Google Scholar
8. Tsutsui, T., Yamamoto, K., Jpn. J. Appl. Phys. 38, 2799 (1999).Google Scholar