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In-Situ Observation of The Initial Stages of Co (0001) Epitaxy on Pt (111) Using Grazing Incidence X-Ray Diffraction

Published online by Cambridge University Press:  15 February 2011

James A. Bain ,
Bruce M. Clemens  and
Sean Brennan
James A. Bain
Affiliation:
Dept. of Materials Science and Engineering, Stanford University, Stanford CA, 94305-2205
Bruce M. Clemens
Affiliation:
Dept. of Materials Science and Engineering, Stanford University, Stanford CA, 94305-2205
Sean Brennan
Affiliation:
Stanford Synchrotron Radiation Lab, Stanford, CA 94305
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Abstract

The heteropitaxial growth of (111) Pt on (0001) sapphire and of (0001) Co on (111) Pt on (0001) sapphire has been observed in-situ using grazing incidence x-ray scattering (GIXS). The in-plane lattice parameters of the Pt and Co phases have been measured as a function of film thickness in the regime from two monolayers to 200 monolayers, Relaxation of elastic strain with thickness has been quantified. X-ray reflections consistent with stacking faults in the Co films have been observed and monitored as a function of thickness, giving a measure of the stacking fault density. A distinct Co phase was observed at two monolayers of Co on a thick Pt layer, indicating an incoherent interface between the Co and Pt, even at this very early stage of deposition.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 312: Symposium P – Common Themes and Mechanisms of Epitaxial Growth , 1993 , 291
Copyright
Copyright © Materials Research Society 1993

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References

1. Carcia, P.F. and Zeper, W.B., IEEE Trans. Mag., 26, 1703 (1990).Google Scholar
2. Hashimoto, S., Ochiai, Y. and Aso, K,Google Scholar
3. Chien, C.J., Farrow, R.F.C., Lee, C.H., Lin, C.J. and Marinero, E.E., J. of Mag. and Mag. Mat., 93, 47 (1991).CrossRefGoogle Scholar
4. Spörl, K. and Weller, D., J. of Mag. and Mag. Mat., 93, 379 (1991).CrossRefGoogle Scholar
5. Fuoss, P.H. and Brennan, S., in Annual Review of Materials Science, edited by R.A., Huggins, J.A., Giordmaine, and J.B., Wachtman, Jr. (20, Palo Alto, CA, Annual Reviews, 1990) pp. 365–390.Google Scholar
6. Payne, A. P., Clemens, B.M. and Brennan, S., Rev. Sci. Instrum., 63, 1147 (1992).Google Scholar