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Interface Structure and Solid State Reactions of Fe/Zr Multilayers

Published online by Cambridge University Press:  25 February 2011

Bruce M. Clemens  and
D. L. Williamson
Bruce M. Clemens
Affiliation:
Physics Department. General Motors Research Laboratories Warren, Michigan 48090-9055
D. L. Williamson
Affiliation:
Department of Physics, Colorado School of Mines, Golden Colorado 80401
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Abstract

Iron zirconium multilayer films were prepared by electron beam evaporation and by sputter deposition. Layer thicknesses were varied from 50 monolayers of each constituent down to 2 monolayers. Conversion electron Mössbauer spectroscopy, x-ray diffraction, and Auger spectroscopy have been used to characterize multilayers in the as-deposited and annealed state. Amorphous phase formation occurs during thermal anneals, and samples with layer thicknesses of 5 monolayers or less of each constituent are amorphous as deposited. Amorphous interfaces are observed in all samples, with this interface region being larger in the electron beam evaporated samples than in the sputter deposited samples.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 103 , 1987 , 159
Copyright
Copyright © Materials Research Society 1988

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References

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