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Investigation of Organic-Organic Interfaces by Time-Resolved Photocurrent, Electrochemical, And Photoemission Techniques

Published online by Cambridge University Press:  10 February 2011

Liang-Bih Lin
Affiliation:
Center for Photoinduced Charge Transfer and University of Rochester, Rochester, NY 14627 Office Imaging Division and Rochester, NY 14650
M. Gary Mason
Affiliation:
Center for Photoinduced Charge Transfer and University of Rochester, Rochester, NY 14627 Imaging Research and Advanced Development, Eastman Kodak Company, Rochester, NY 14650
Ralph H. Young
Affiliation:
Center for Photoinduced Charge Transfer and University of Rochester, Rochester, NY 14627 Imaging Research and Advanced Development, Eastman Kodak Company, Rochester, NY 14650
Deniz E. Schildkraut
Affiliation:
Imaging Research and Advanced Development, Eastman Kodak Company, Rochester, NY 14650
Paul M. Borsenberger
Affiliation:
Center for Photoinduced Charge Transfer and University of Rochester, Rochester, NY 14627 Office Imaging Division and Rochester, NY 14650
Samson A. Jenekhe
Affiliation:
Center for Photoinduced Charge Transfer and University of Rochester, Rochester, NY 14627 Departments of Chemical Engineering and Chemistry, University of Rochester, Rochester, NY 14627
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Abstract

Hole transporting properties and energy barriers at organic-organic interfaces relevant to electrophotographic and organic electroluminescent (EL) devices are described. Three wellknown hole transporting molecules, 1,1-bis(di-4-tolylaminophenyl)cyclohexane (TAPC), N,N′- diphenyl-N,N′-bis(1 -naphthyl)-(1,1 ′-biphenyl)-4,4′-diamine (NPB), and N,N,N′,N′-tetrakis(4- tolyl)-(1,1 ′-biphenyl)-4,4′-diamine (TTB) are used in this study. The ionization potentials (IP) and oxidation potentials (Eox) of these materials are determined by photoemission spectroscopy and electrochemical measurements, from which a conversion formula is obtained (IP ∼ 4.5 eV + eEox). Hole transport across organic-organic interfaces is investigated by time-of-flight transient photocurrent techniques. The efficiencies of hole injection are consistent with the energy barriers, when present, at these interfaces.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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