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Investigation of Porous Silicon Films Structure by Optical Methods

Published online by Cambridge University Press:  28 February 2011

P. Basmaji ,
V. Grivickas ,
G. I. Surdutovich ,
R. Vitlina  and
V. S. Bagnato
P. Basmaji
Affiliation:
Institute de Física e Química de Säo Carlos - USP, Sao Carlos, SP, 13560–970, Brazil
V. Grivickas
Affiliation:
Institute de Física e Química de Säo Carlos - USP, Sao Carlos, SP, 13560–970, Brazil
G. I. Surdutovich
Affiliation:
Institute de Física e Química de Säo Carlos - USP, Sao Carlos, SP, 13560–970, Brazil
R. Vitlina
Affiliation:
Institute de Física e Química de Säo Carlos - USP, Sao Carlos, SP, 13560–970, Brazil
V. S. Bagnato
Affiliation:
Institute de Física e Química de Säo Carlos - USP, Sao Carlos, SP, 13560–970, Brazil
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Abstract

The structure of aged porous silicon (PS) has been investigated using reflectivity, photoluminescence (PL), optical absorption and photoconductivity decay. An optical anisotropy in a perpendicular to surface direction is observed for PS samples below a critical porosity of 70%. The photostability of the PL spectra imply three different structures of PS, these should be attributed to quantum size structures, polymeric type structures and fluor-related structures. The absorption edge is deconvoluted into a band-to-band absorption with energy ranging between Eg = 1.6–2 eV and an absorption shoulder at hu ≤ Eg. The high energy PL band around 2.3 eV resembles that of fluoroindate glass. The observed rapid lifetime at high injection level is attributed to excitonic Auger-type recombination.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 283: Symposium F – Microcrystalline Semiconductors–Materials Science and Devices , 1992 , 227
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

[1] Canham, L., Phys. World 41, March (1992).Google Scholar
[2] Fuchs, H.D., Stutzmann, M., Brandt, M.S., Rosenbauer, M., Weber, J. and Cardona, M., Physica Scripta T 45, 309 (1992).Google Scholar
[3] Grivickas, V. and Basmaji, P., submitted to Appl. Phys. Lett.Google Scholar
[4] Buda, F., Kohanoff, J. and Parrinello, M., Phys. Rev. Lett. 69, 1272 (1992).Google Scholar
[5] Cardoso, C.X., Messaddeq, Y., Nunes, L.A.O. and Aegerter, M.A. - Proc. of 8th Int. Symp. of Halide Glasses, Perrus-Guiree, France, 1992 (in press).Google Scholar
[6] Yota, J. and Burrows, V.A., J. Appl. Phys. 69, 7369 (1991).Google Scholar
[7] Koshida, N. and Koyama, H., Appl Phys. Lett. 60, 347 (1992).Google Scholar