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Magnetic Anisotropy Determined from Angular Dependent Magnetization Measurements

Published online by Cambridge University Press:  26 February 2011

P.J.H. Bloemen ,
E.A.M. Van Alphen ,
W.J.M. De Jonge  and
F.J.A. Den Broeder
P.J.H. Bloemen
Affiliation:
Department of Physics, Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands
E.A.M. Van Alphen
Affiliation:
Department of Physics, Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands
W.J.M. De Jonge
Affiliation:
Department of Physics, Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands
F.J.A. Den Broeder
Affiliation:
Philips Research Laboratories, 5600 JA Eindhoven, The Netherlands
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Abstract

It is shown that a (biaxial) vibrating sample magnetometer (VSM) can be used to determine the magnetic anisotropy of thin films. Besides the commonly measured component along the magnetic field also the component perpendicular to the magnetic field was measured. Experiments were performed in a magnetic field of fixed magnitude as a function of the angle between the field and the film plane. These type of measurements give both an accurate estimate of the magnetic anisotropy and also show when domains are formed during rotation of the magnetization. The method has been applied to determine the magnetic anisotropy of Co/Pd and Co/Cu multilayers. The results are compared to those obtained with alternative methods.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 231: Symposium S – Magnetic Surfaces, Thin Films and Multilayers , 1991 , 479
Copyright
Copyright © Materials Research Society 1992

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References

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