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Microstructure and Luminescence Properties of ZnS:Cu Powders and Electroluminescent Lamps

Published online by Cambridge University Press:  10 February 2011

Luigi Sangaletti
Affiliation:
Istituto Nazionale per la Fisica della Materia and Dipartimento di Chimica e Fisica per l'Ingegneria e per i Materiali, Università di Brescia, Via Branže, 38 – 25123 Brescia, ITALY
Laura E. Depero
Affiliation:
Istituto Nazionale per la Fisica della Materia and Dipartimento di Chimica e Fisica per l'Ingegneria e per i Materiali, Università di Brescia, Via Branže, 38 – 25123 Brescia, ITALY
Brigida Allieri
Affiliation:
Istituto Nazionale per la Fisica della Materia and Dipartimento di Chimica e Fisica per l'Ingegneria e per i Materiali, Università di Brescia, Via Branže, 38 – 25123 Brescia, ITALY
Livio Antonini
Affiliation:
ELCOM Laboratories, Via Brescia 269, Nave BS, ITALY
Roberto Fantini
Affiliation:
ELCOM Laboratories, Via Brescia 269, Nave BS, ITALY
Marco Bettinelli
Affiliation:
Istituto Policattedra, Università di Verona, Ca’ Vignai, Verona, ITALY
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Abstract

We report on a microscopy and diffraction study of commercially available Cu-doped ZnS powders, along with an optical spectroscopy study of electroluminescent lamps fabricated with these powders. The results allowed us to identify a correlation between the microstructure and the optical properties (i.e. photoluminescence) of the ZnS powders. It is found that the best powders for EL lamps are those displaying a prevalent cubic, i.e. zincblend, structure, while the poor performances of the mixed phase (cubic + hexagonal) are tentatively ascribed to the quenching of luminescence due to defects (stacking faults) introduced into the cubic structure and resulting in a considerable amount of hexagonal phase, as detected by XRD. The mostly cubic powders have been selected to realize EL lamps. The optical properties of these lamps have been investigated by photoluminescence and electroluminescence spectroscopies with the aim to identify the degradation mechanisms leading to a decrease of brightness. The quenching of electroluminescence is primarily ascribed to a deterioration of the electrical contacts. However, the reduced brightness in photoluminescence spectra seems to indicate that additional quenching of luminescence is induced by transformations at the emitting layer of the lamps. This degradation is tentatively ascribed to the presence of voids in the emitting layer, which might induce, acting as traps for moisture, transformations in the optical and electrical properties of the transparent electrode (ITO).

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

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