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Modeling of Channel Formation in Organic Field Effect Transistors

Published online by Cambridge University Press:  15 March 2011

T. Li
Affiliation:
Department of Electrical and Computer Engineering, University of Minnesota Minneapolis, MN 55455, USA
P. P. Ruden
Affiliation:
Department of Electrical and Computer Engineering, University of Minnesota Minneapolis, MN 55455, USA
I. H. Campbell
Affiliation:
Los Alamos National Laboratory Los Alamos, NM 87545, USA
D. L. Smith
Affiliation:
Los Alamos National Laboratory Los Alamos, NM 87545, USA
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Abstract

We report results of two-dimensional electrostatic modeling for (top-contact) organic field effect transistors, focusing on the formation of the conductive channel. The effect on channel formation of the choice of the source and drain contact metal is investigated. High work function metal (e.g., gold) source and drain contacts produce a conducting p-type region near these contacts. In contrast, low work function metal source and drain contacts (e.g., magnesium) lead to depleted regions. In the center of the device, between the source and drain contacts, the channel carrier density at a fixed gate bias is determined by the work function of the gate contact material, and is essentially independent of the metal used to form the source and drain contacts. The dependence of the transistor threshold voltage on the gate contact metal work function and the device implications of the spatial variation of the induced charge density are discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

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References

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