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Nanocrystal Thickness Information From Z-STEM: 3-D Imaging in One Shot

Published online by Cambridge University Press:  10 February 2011

A.V. Kadavanich ,
T. Kippeny ,
M. Erwin ,
S. J. Rosenthal  and
S. J. Pennycook
A.V. Kadavanich
Affiliation:
Oak Ridge National Laboratory, Solid State Division, Oak Ridge, TN 37831 Vanderbiltg University, Department of Chemistry, Nashville, TN 37235
T. Kippeny
Affiliation:
Vanderbiltg University, Department of Chemistry, Nashville, TN 37235
M. Erwin
Affiliation:
Vanderbiltg University, Department of Chemistry, Nashville, TN 37235
S. J. Rosenthal
Affiliation:
Vanderbiltg University, Department of Chemistry, Nashville, TN 37235
S. J. Pennycook
Affiliation:
Vanderbiltg University, Department of Chemistry, Nashville, TN 37235
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Abstract

We have applied Atomic Number Contrast Scanning Transmission Electron Microscopy (Z-Contrast STEM) towards the study of colloidal CdSe semiconductor nanocrystals embedded in MEH-PPV polymer films.

For typical nanocrystal thicknesses, the image intensity is a monotonic function of thickness. Hence an atomic column-resolved image provides information both on the lateral shape of the nanocrystal, as well as the relative thickness of the individual columns.

We show that the Z-Contrast image of a single CdSe nanocrystal is consistent with the predicted 3-D model derived from considering HRTEM images of several nanocrystals in different orientations. We further discuss the possibility of measuring absolute thicknesses of atomic columns if the crystal structure is known.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 589 , 1999 , 229
Copyright
Copyright © Materials Research Society 2001

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