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A New Method of Preparing Tilt Boundaries for High Resolution Electron Microscopy

Published online by Cambridge University Press:  21 February 2011

William Krakow  and
Victor Castańo
William Krakow
Affiliation:
IBM Corporation, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598, USA
Victor Castańo
Affiliation:
IBM Corporation, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598, USA
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Abstract

A new method of preparing bicrystal substrates of NaCl with a common tilt zone axis has been developed. Upon a lateral overgrowth of NaCl, bridging the two mechanically polished and oriented crystals, very thin films can then be vapor deposited. Au bicrystals of ∼ 75Å thickness and b.c.c. Cr films of similar thickness with grain boundaries have been fabricated.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 115: Symposium W – Specimen Preparation for Transmission Electron Microscopy of Materials I , 1987 , 185
Copyright
Copyright © Materials Research Society 1988

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References

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