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Optical properties of CdSe and CdTe nanoparticles embedded in SiO2 films

Published online by Cambridge University Press:  26 February 2011

P. Babu Dayal ,
B. R. Mehta  and
P. D. Paulson
P. Babu Dayal
Affiliation:
Department of Physics, Indian Institute of Technology Delhi, New Delhi-16, India.
B. R. Mehta
Affiliation:
Department of Physics, Indian Institute of Technology Delhi, New Delhi-16, India.
P. D. Paulson
Affiliation:
Institute of Energy Conversion, University of Delaware, Newark, Delaware-19716, USA.
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Abstract

CdSe and CdTe nanoparticles dispersed in silicon dioxide films have been grown by magnetron sputtering technique followed by thermal annealing. Effect of thermal annealing conditions on the structural and optical properties of CdTe and CdSe nanoparticles has been studied. Glancing angle x-ray diffraction (GAXRD), optical absorption (OA), transmission electron microscope (TEM) and spectroscopic ellipsometry (SE) techniques have been used to study the crystal structure, particle size and dielectric function spectra of nanoparticles. ε2 spectra of CdTe nanoparticles show a decrease in dielectric constant values in comparison to bulk CdTe. ε2″ spectrum of CdTe nanoparticles show four critical points in the electronic band structure of CdTe. Optical absorption studies in the case of CdTe and CdSe nanoparticles clearly show the blue shift of fundamental absorption edge due to quantum confinement effect.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 829: Symposium B – Progress in Compound Semiconductor Materials IV – Electronic and Optoelectronic Applications , 2004 , B9.5
Copyright
Copyright © Materials Research Society 2005

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References

REFERENCES

1. Woggon, U., optical properties of semiconductor quantum dots, Springer-Verlag, Berlin, 1997.Google Scholar
2. Acioli, L. H., Gomes, A. S. L., Rios Leite, J. R. and De Araujo, Cid B., IEEE. J. Quantum Electron. 26, 1277 (1990)Google Scholar
3. Bigot, J. Y., Fidorra, F., Klingshirn, C. and Grun, J. B., IEEE. J. Quantum Electron. 21, 1480 (1985)Google Scholar
4. Jain, R. K. and Lind, R. C., J. Opt. Soc. Am. 73, 647 (1983)Google Scholar
5. Meldrum, Al., Haglund, R. F. Jr, Boatner, L. A. and White, C. W., Adv. Mater. 13, 1431 (2001).Google Scholar
6. Li, L. S., Hu, J., Yang, N. and Alivisatos, A. P., Nano. Lett. 1, 349 (2001).Google Scholar
7. Wang, X-Y., Zhang, J-Y., Wazzal, A., Darragh, M. and Xino, M., Appl. Phys. Lett. 81, 4829 (2002)Google Scholar
8. Ijima, S. I., Nature (London) 354, 56 (1991).Google Scholar
9. Tang, Z., Kotov, N. A., Giergig, M., Science 297, 237 (2002).Google Scholar
10. Gao, X., Chan, W. C. W. and Nie, S., J. Bio-med. Optics 7, 532 (2002).Google Scholar
11. Huynh, W. H., Ditlmer, J. J. and Alivisatos, A. P., Science 295, 2425 (2002)Google Scholar
12. Simmons, J. H., J. Non-cryst. Solids 239, 1 (1998) [Morey Award Paper]Google Scholar
13. Resifeld, R., J. Alloys. Comp. 341, 56 (2002)Google Scholar
14. Bondar, I. V. et al, Semiconductors 36, 298 (2002); In-org. Mater. 40, (2004) 115Google Scholar
15. Babu Dayal, P., Ph. D. Thesis, Indian Institute of Technology Delhi, December 2004 India.Google Scholar
16. Tsunetomo, K., Nasu, H., Katiyama, H., Kawabuchi, A, Osaka, Y., Jpn. J. Appl. Phys. 28, 1928 (1989)Google Scholar
17. Potter, B. G. and Simmons, J. H., Phys. Rev. B. 43, 2234 (1991)Google Scholar
18. Masumoto, Y. and Sonobe, K., Phys. Rev. B 56, 9734 (1997)Google Scholar
19. Yang, J., Yang, X-L, Lu, S. H., Liu, X-M., Qian, Y-T., Mat. Res. Bull. 35, 1509 (2000)Google Scholar
20. Babu Dayal, P., Mehta, B.R., Shivaparasad, S. M. and Aparna, Y., Appl. Phys. Lett. 81, 4254 (2002)Google Scholar
21. Joint Committee on Powder Diffraction Standards, Data cards, Cubic CdTe: 15–770, Cubic CdSe: 16–191 Google Scholar
22. Babu Dayal, P., Mehta, B.R. and Paulson, P. D. (Revised manuscript submitted to Phys. Rev. B)Google Scholar
23. Palik, E. D., Optical constants of solids, Vol. I. Academic Press, New York, 1978.Google Scholar
24. Adachi, S., Kimura, T. and Suzuki, N., J. Appl. Phys. 74, (1993) 3435 Google Scholar
25. Rossler, , Landolt-Bornstein, , Numerical data and functional relationships in semiconductor science and technology, 17d, p-210, 1982 Google Scholar