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Organic Charge-Transfer Complexes for High Density Storage Using a Modified Scanning Tunneling Microscope

Published online by Cambridge University Press:  15 February 2011

Shoji Yamaguchi ,
Carlos A. Valenzuela  and
Richard S. Potember
Shoji Yamaguchi
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory, Johns Hopkins Road, Laurel, Maryland 20723, U.S.A.
Carlos A. Valenzuela
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory, Johns Hopkins Road, Laurel, Maryland 20723, U.S.A.
Richard S. Potember
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory, Johns Hopkins Road, Laurel, Maryland 20723, U.S.A.
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Abstract

We are investigating organometallic materials which exhibit a novel fieldinduced reversible switching phenomenon. Silver and copper salts of tetracyanoquinodimethane (TCNQ) and its derivatives, prepared as polycrystalline thick films and vacuum-deposited thin films, have been imaged using a scanning tunneling microscope (STM). We have recently produced images with molecular resolution of these materials. We also have demonstrated a field-induced, charge-transfer reaction driven by the electric field at the STM tip when the field generated by the STM exceeds the switching threshold of the organic charge-transfer complex. The phase transition induced by the STM tip appears as nanometer to micrometer-sized domains on the metal-TCNQ and derivatives surface. This STM-induced chemical reaction is being explored for use in a molecular-based information storage system.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 276: Symposia U/Y – Smart Materials Fabrication and Materials for Micro-Electro-Mechanical Systems , 1992 , 265
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

[1] Thomson, D. J., J. Microscopy (Oxford), 152, 627 (1988)Google Scholar
[2] Yamaguchi, S., Viands, C. A., and Potember, R. S., J. Vac. Sci. Technol.,B9, 1129 (1991)Google Scholar
[3] Matsumoto, M., Nishio, Y., Tachikbana, H., Nakanmura, T., Kawabata, Y., Samura, H. and Nagamura, T., Chem. Lett., 1021 (1991)Google Scholar
[4] Potember, R. S., Poehler, T. O., Rappa, A., Cowan, D. O. and Bloch, A. N., Syn. Metals, 4, 371 (1982)CrossRefGoogle Scholar
[5] Kamitsos, E. I., Tzinis, C. H., and Risen, W. M. Jr., Solid State Commun. 42, 561 (1982)Google Scholar