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Origins of Contrast in Near-Field Scanning Optical Microscopy Photovoltage Images of Cu(In,Ga)Se2 Solar Cells

Published online by Cambridge University Press:  10 February 2011

A. A. McDaniel  and
J. W. P. Hsu
A. A. McDaniel
Affiliation:
Physics Department, University of Virginia, Charlottesville, VA 22901
J. W. P. Hsu
Affiliation:
Physics Department, University of Virginia, Charlottesville, VA 22901
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Abstract

Photovoltage images of Cu(In,Ga)Se2 solar cells taken using near-field scanning optical microscopy (NSOM) show reduction of photoresponse along grain boundaries. Two factors might be responsible for this contrast. The first is that the topographic changes associated with the grains could cause the NSOM tip to move further from the sample, resulting in a reduction in photoresponse. The second possibility is that the contrast is due to real physical properties of the sample, e.g. higher recombination velocities near grain boundaries. We show convincing evidence that the major contribution to the contrast in the photovoltage images is due to the latter.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 472: Symposium I – Polycrystalline Thin Films - Structure, Texture, Properties..III , 1997 , 209
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

2 McDaniel, A. A., Hsu, J. W. P., and Gabor, A. M., submitted to Appl. Phys. Lett.Google Scholar
2 Weston, Kenneth D., DeAro, Jessie A., and Buratto, Steven K., Rev. Sei. Instrum. 67(8), 2924 (1996).Google Scholar
3 Weston, Kenneth D. and Buratto, Steven K., to appear in J. Phys. Chem.Google Scholar
4 Betzig, E., Trautman, J. K., Harris, T. D., Weiner, J. S., and Kostelak, R. L., Science 251, 1468 (1991).Google Scholar
5 Hsu, J. W. P., Lee, M., Deaver, B. S., Rev. Sci. Instrum. 66, 3177 (1995);Google Scholar
Lee, Mark, McDaniel, E. B., and Hsu, J. W. P., Rev. Sei. Instrum. 67, 1468 (1996).Google Scholar
6 Gabor, Andrew M., Tuttle, John R., Albin, David S., Contreras, Miguel A., Noufi, Rommel, and Hermann, Allen M., Appl. Phys. Lett. 65(2), 198 (1994).Google Scholar