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Polypropylene-Functionalized Probes for Scanning Force Microscopy

Published online by Cambridge University Press:  17 March 2011

L. González-Ronda ,
S. L. Kaberline  and
E. L. Durieux
L. González-Ronda
Affiliation:
Department of Materials Science, Ford Research Laboratory, Dearborn, MI 48124, U.S.A.
S. L. Kaberline
Affiliation:
Department of Chemistry and Environmental Science, Ford Research Laboratory, Dearborn, MI 48124, U.S.A.
E. L. Durieux
Affiliation:
Department of Physical Chemistry, Flint Ink Research Center, Ann Arbor, MI 48103, U.S.A.
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Abstract

SFM probe tips have been functionalized with polypropylene (PP) layers by immersion into dilute solution. The immersion process was carefully controlled and monitored using a programmable dynamic contact angle analyzer (DCA) equipped with a microbalance and a motor capable of speeds ranging from 2-24 μm/s. Probes were submitted to treatment with ozone prior to coating to eliminate surface contamination, particularly silicone oils, resulting from commercial packaging methods. The chemical composition of the tip surface after the cleaning, coating, and scanning processes was analyzed by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS). The three-dimensional tip shape and dimensions before and after coating were evaluated by blind reconstruction from images of a columnar titanium thin film using Digital Instruments' Tip Evaluation algorithm. Coating thicknesses of up to 20 nm were calculated, with the thicker coatings showing a larger degree of non-uniformity.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 710: Symposia DD – Polymer Interfaces and Thin Films , 2001 , DD14.6.1
Copyright
Copyright © Materials Research Society 2002

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References

REFERENCES

1. Noy, A., Vezenov, D. V., Lieber, C. M., Ann. Rev. Mater. Sci. 27, 381 (1997).Google Scholar
2. Noy, A., Frisbie, C. D., Rozsnyai, L. F., Wrighton, M. S., Lieber, C. M., J. Am. Chem. Soc. 117, 7943 (1995).Google Scholar
3. Nakagawa, T., Ogawa, K., Kurumizawa, T., Ozaki, S., Jpn. J. Appl. Phys. 32, L294 (1993).Google Scholar
4. Lo, Y.-S., Huefner, N. D., Chan, W. S., Dryden, P., Hagenhoff, B., Beebe, T. P. Jr, Langmuir 15, 6522 (1999).Google Scholar
5. White, M. L., “The detection and control of organic contaminants on surfaces”, Clean Surfaces, ed. Goldfinger, G. (Marcel Dekker, 1970) pp. 361–373.Google Scholar
6. Villarubia, J. S., Surf. Sci. 321, 287 (1994).Google Scholar
7. Westra, K. L., Mitchell, A. W., Thomson, D. J., J. App. Phys. 74, 3608 (1993).Google Scholar
8. Westra, K. L., Thomson, D. J., Thin Solid Films 257, 15 (1995).Google Scholar
9. Vesenka, J., Manne, S., Giberson, R., Marsh, T., Henderson, E., Biophys. J. 65, 992 (1993).Google Scholar
10. Adamson, A. W., Physical chemistry of surfaces (John Wiley & Sons, 1997).Google Scholar