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Precipitation of Krypton in an Amorphous Ti-Cr Alloyc.

Published online by Cambridge University Press:  28 February 2011

W. Allen  and
R. C. Birtcher
W. Allen
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA
R. C. Birtcher
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA
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Abstract

Results of a TEM investigation of the microstructural changes produced by the room temperature implantation of energetic Kr+ ions into a glassy Ti-Cr thin film are reported. As in other metals, the Kr precipitates as solid crystallites. The precipitation of crystalline Kr is accompanied by ultrafine crystallization of the metal host around each Kr crystal. With increasing fluence, the Kr precipitates grow to a critical size at which they melt, and the adjacent fine metal crystals disappear. A new TEM imaging technique is described briefly which utilizes the small angle electron scattering fine structure and which in principle is capable of revealing all fine particles simultaneously.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 74: Symposium A – Beam-Solid Interactions and Transient Processes , 1986 , 351
Copyright
Copyright © Materials Research Society 1987

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References

1. Birtcher, R. C. and Jager, W., Ultramicroscopy 21 (to be published).Google Scholar
2. Birtcher, R. C. and Liu, A. S., this conference.Google Scholar
3. Taylor, A., Wallace, J. R., Ryan, E. A., Philippides, A. and Wrobel, J. R., Nucl. Instr. and Meth. 189, 211 (1981).CrossRefGoogle Scholar
4. Biersack, J. and Haggmark, L. G., Nucl. Instr. and Meth. 174, 257 (1980).CrossRefGoogle Scholar
5. Allen, C. W., Rehn, L. E., Okamoto, P. R. and Wiedersich, H., in Electron Microscopy 1986. edited by Imura, T., Maruse, S. and Suzuki, T. (Japanese Society of Electron Microscopy Tokyo, 1986) pp. 1099–1100.Google ScholarPubMed
6. Allen, C. W. and Okamoto, P. R., Phys. Stat. Sol. (a) 36, 107 (1976).CrossRefGoogle Scholar