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Pump-Probe Measurements Using Silicon Nanocrystal Waveguides

Published online by Cambridge University Press:  10 February 2011

Nathanael Smith ,
Max J. Lederer ,
Marek Samoc ,
Barry Luther-Davies  and
Robert G. Elliman
Nathanael Smith
Affiliation:
1Electronic Materials Engineering Department
Max J. Lederer
Affiliation:
Laser Physics Centre, Research School of Physical Sciences and Engineering, Australian National University, Canberra, Australia
Marek Samoc
Affiliation:
Laser Physics Centre, Research School of Physical Sciences and Engineering, Australian National University, Canberra, Australia
Barry Luther-Davies
Affiliation:
Laser Physics Centre, Research School of Physical Sciences and Engineering, Australian National University, Canberra, Australia
Robert G. Elliman
Affiliation:
1Electronic Materials Engineering Department
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Abstract

Optical pump-probe measurements were performed on planar slab waveguides containing silicon nanocrystals in an attempt to measure optical gain from photo-excited silicon nanocrystals. Two experiments were performed, one with a continuous-wave probe beam and a pulsed pump beam, giving a time resolution of approximately 25 ns, and the other with a pulsed pump and probe beam, giving a time resolution of approximately 10 ps. In both cases the intensity of the probe beam was found to be attenuated by the pump beam, with the attenuation increasing monotonically with increasing pump power. Time-resolved measurements using the first experimental arrangement showed that the probe signal recovered its initial intensity on a time scale of 45-70 μs, a value comparable to the exciton lifetime in Si nanocrystals. These data are shown to be consistent with an induced absorption process such as confined carrier absorption. No evidence for optical gain was observed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 770: Symposium I – Optoelectronics of Group-IV-Based Materials , 2003 , I3.2
Copyright
Copyright © Materials Research Society 2003

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References

1. Takeda, H. T., Ogawa, H., Yamazaki, Y., Ishizaki, A. and Nakagiri, T., Applied Physics Letters. 2379, 2379 (1990)Google Scholar
2. Canham, L. T., Applied Physics Letters. 57(10), 1046 (1990)Google Scholar
3. Franzo, G., Pacifici, D., Vinciguerra, V. and Priolo, F., Applied Physics Letters. 76(16), 2167 (2000)Google Scholar
4. Franzo, G., Vinciguerra, V. and Priolo, F., Applied Physics A. 1, 1 (1999)Google Scholar
5. Cheylan, S. and Elliman, R. G., Nuclear Instruments and Methods in Physics Research B. 175-422, 422 (2001)Google Scholar
6. Kovalev, D., Heckler, H., Polisski, G. and Koch, F., Physica Status Solidi B. 871, 871 (1999)Google Scholar
7. Ledoux, G., Guillois, O., Porterat, D., Reynaud, C., Huisken, F., Kohn, B. and Paillard, V., Physical Review B. 15942, 15942 (2000)Google Scholar
8. Iacona, F., Franzo, G. and Spinella, C., Journal of Applied Physics. 87(3), 1295 (2000)Google Scholar
9. Pavesi, L., DalNegro, L., Mazzoleni, C., Franzo, G. and Priolo, F., Nature. 440, 440 (2000)Google Scholar
10. Brongersma, M. L., Polman, A., Min, K. S., Boer, E., Tambo, T. and Atwater, H. A., Applied Physics Letters. 72(20), 2577 (1998)Google Scholar
11. Linnros, J., Lalic, N., Galeckas, A. and Vytautas, G., Journal of Applied Physics. 86(11), 6128 (1999)Google Scholar