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Quantitative Electron Diffraction for Crystal Structure Determination
Published online by Cambridge University Press: 31 January 2011
Abstract
We present a quantitative investigation of data quality using electron precession, compared to standard selected-area electron diffraction (SAED). Data can be collected on a CCD camera and automatically extracted by computer. The critical question of data quality is addressed – can electron diffraction data compete with X-ray diffraction data in terms of resolution, completeness and quality of intensities?
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- Copyright © Materials Research Society 2009