Hostname: page-component-7bb8b95d7b-l4ctd Total loading time: 0 Render date: 2024-09-17T08:21:45.887Z Has data issue: false hasContentIssue false

Real time measurement of photochemical surface reactions by using a total reflection prism

Published online by Cambridge University Press:  01 February 2011

Yuki Sato
Affiliation:
yuking0315@yahoo.co.jp, Tokai University, Dept of E&EE, 1117 Kitakaname Hiratsuka-shi, Kanagawa, N/A, 259-1292, Japan, 0463-58-1211, 0463-59-4014
Yuji Sato
Affiliation:
yuzzy99@yahoo.co.jp, Tokyo Institute of Technology, Entropia Laser Initiative, Japan
Masataka Murahara
Affiliation:
murahara@vesta.ocn.ne.jp, Tokyo Institute of Technology, Entropia Laser Initiative, Japan
Get access

Abstract

The photochemical reaction processes, i.e., photo-dissociation of a reaction solution, defluorination of fluorocarbon [FEP], and substitution of a hydrophilic group, were measured in real time, when irradiating a Xe2 excimer lamplight on the water or ammonia solution as a reaction solution and FEP placed on the attenuated total reflectance [ATR] prism. In case of ammonia solution, with the increase in irradiation time, the absorption peaks of 3300 cm−1 and 1650 cm−1 gradually decreased, and the new absorption of -CF2-NH2 gradually appeared at 1410 cm−1, which presented the strongest absorption after UV irradiation for 25 minutes. The results indicate that the ammonia water has turned to amino groups. In addition, the contact angle of water was measured. When compared to the untreated sample, whose contact angle was 110 degrees, the contact angle of the sample treated with water became 31 degrees after the Xe2 lamp irradiation for 25 minutes, and that of the sample modified by ammonia water further improved to 27 degrees after the irradiation for 25 minutes.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Nelson, E. R., Kilduff, T. J., and Benderly, A. A., Ing. Eng. Chem., 50, pp.329 (1958)Google Scholar
2. Nakao, A., Kaibara, M., Iwaki, M., Suzuki, Y., and Kusakabe, M., Surface and Interface Analysis, 24, 252256 (1996)Google Scholar
3. Park, Y. W., Tasaka, S., and Inagaki, N., J. Appl. Polym. Sci. 83, 12581267 (2002)Google Scholar
4. Fakes, D. W., Newton, J. M., Watts, J. F., and Edgell, M. J., Surface and Interface Analysis, 10, 416423(1987)Google Scholar
5. Okoshi, M., Murahara, M., and Toyoda, K., J. Mater. Res. 7, 19121916 (1992)Google Scholar
6. Murahara, M. and Okoshi, M., J. Adhesion Sci. Technol. 9, 15931599 (1995)Google Scholar
7. Murahara, M. and Toyoda, K., J. Adhesion Sci. Technol. 9, 16011609 (1995)Google Scholar
8. Okoshi, M. and Murahara, M., App. Phys. Lett. 72, 26162618 (1998)Google Scholar
9. Okabe, H., Photochemistry of Small Molecules, (a Wiley Interscience, N. Y., 1978) 62163 Google Scholar
10. Ikegame, T. and Murahara, M., Mat. Res. Soc. Symp. Proc. 544, 227232 (1999)Google Scholar
11. Sato, Y. and Murahara, M., Mat. Res. Soc. Symp. Proc., 843, pp.323328, (2004)Google Scholar