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Scanning Acoustic Microscopy and x-ray Diffraction Investigation of Near Crack Tip Stresses

Published online by Cambridge University Press:  10 February 2011

S. Sathish  and
R. W. Martin
S. Sathish
Affiliation:
University of Dayton Research Institute, 300 College Park, Dayton, OH 45469-0127
R. W. Martin
Affiliation:
University of Dayton Research Institute, 300 College Park, Dayton, OH 45469-0127
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Abstract

Scanning Acoustic Microscopy has been used to measure and map the Rayleigh wave velocity and the Surface Skimming Longitudinal wave velocities near a crack tip in a sample of Ti-6AI-4V. X-ray diffraction measurements have been performed to map the stress in the same region of the sample. The differences in the contrast between the two acoustic velocity images and their sensitivity to stress are examined. Similarities between x-ray stress images and acoustic velocity images are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 591 , 1999 , 55
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

1.Sanford, R. J., Experimental Mechanics, 29, p241 (1989)Google Scholar
2.Williams, D. R., Davidson, D. L. and Lankford, J., Experimental Mechanics, 20, p. 134 (1980)Google Scholar
3.Allison, J. E., “Measurement of crack-tip stress distribution by x-ray diffraction”, In Fracture Mechanics, STP 677, p. 550. Philadelphia: American Society for Testing and Materials, (1979).Google Scholar
4.Ravi-Chander, K. and Schneider, E., Res. Nondestr. Eval. 5, p. 191 (1994)Google Scholar
6.Kim, J. O. and Achenbach, J. D., Ultrasonics, 32, p.359 (1994)Google Scholar
7.Berruti, T., Gola, M. M. and Briggs, G. A. D., J. Acoust. Soc. Am. 103, p. 1370 (1998)Google Scholar
8.Meeks, S. W., Peter, D., Horne, D., Young, K., Novotny, V., Appl. Phys. Lett. 55, p.1835 (1989).Google Scholar
9.Pao, Y. H., Sachse, W., Fukuoka, H., “Acoustoelasticity and ultrasonic measurement of residual stress”. In Physical Acoustics XVIII, p.62, (1984), Edited by Mason, W. P. and Thurston, R. N., Academic Press, New York.Google Scholar
10.Thompson, R. B., Lu, W. Y., Clark, A. V., in Handbook of Measurement of Residual stresses, p. 149, Edited by. Lu, J., Fairmont Press, Lilburn, GA, (1996).Google Scholar
11.Schnieder, E. in Structural and Residual Stress Analysis by Nondestructive Methods, Edited by Hauk, V., p.522, Elsevier, New York, (1997).Google Scholar
12.Kushibiki, J. I. and Chubachi, N., IEEE Trans. SU–32, p. 189 (1985)Google Scholar
13.Yamanaka, K., J. appl. Phys. 54, p. 4323 (1983).Google Scholar
14.Gilmore, R. S., Tam, K., Young, J. D. and Howard, D. R., Phil. Trans. R. Soc. Lond. A320, p. 215 (1986)Google Scholar
15.Sathish, S., Martin, R.W., Matikas, T. E., “Rayleigh wave velocity mapping using scanning acoustic microscope”, in Review of Progress in quantitative NDE, Vol 18B, p.2025, edited by. Thompson, D. O. and Chimenti, D. E., Kluwer Academic/Plenum Publishers, New York, 1998.Google Scholar
16.Fracois, M., Sparauel, J. M., Dehan, C.F., James, M. R., Convert, F.. Lebrun, J. L., Ji, N., Hendriks, R. W., in Handbook of Measurement of Residual stresses, p. 149, Edited by Lu, J., Fairmont Press, Lilburn, GA, (1996).Google Scholar
17.Hauk, V., in Structural and Residual Stress Analysis by Nondestructive Methods, edited by Hauk, V., Elsevier, New York, (1997).Google Scholar
18.Noyan, I. C. and Cohen, J. B., Residual Stress, Springer-Verlag, New York, (1987).Google Scholar
19.Martin, R. W., Sathish, S. and Matikas, T. E., “Development of a scan system for Rayleigh wave velocity mapping” in Review of Progress in quantitative NDE, Vol 18B, p.2031, edited by. Thompson, D. O. and Chimenti, D. E., Kluwer Academic/Plenum Publishers, New York, 1998.Google Scholar
20.Sathish, S. and Martin, R. W. Ultrasonic Symposium (1999) to be publishedGoogle Scholar