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Short Range Order Strucrures in Y-Pr-Ba-Cu-O System Studied by X-Ray Absorption Fine Structure (XAFS) Techniques

Published online by Cambridge University Press:  26 February 2011

Y.H. Kao
Affiliation:
Physics Department, State University of New York at Buffalo, Buffalo, NY 14260
A. Krol
Affiliation:
Physics Department, State University of New York at Buffalo, Buffalo, NY 14260
Z.H. Ming
Affiliation:
Physics Department, State University of New York at Buffalo, Buffalo, NY 14260
C.S. Lin
Affiliation:
Physics Department, State University of New York at Buffalo, Buffalo, NY 14260
Y.L. Soo
Affiliation:
Physics Department, State University of New York at Buffalo, Buffalo, NY 14260
C.X. Gu
Affiliation:
Physics Department, State University of New York at Buffalo, Buffalo, NY 14260
I.S. Yang
Affiliation:
IBM T.J. Watson Research Center, Yorktown Heights, NY 10598
C.C. Tsuei
Affiliation:
IBM T.J. Watson Research Center, Yorktown Heights, NY 10598
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Abstract

Local structure around the constituent atoms in the compound system Y1-xPrxBa2CU3O7-y has been investigated by means of x-ray absorption fine structure (XAFS) techniques. By comparing the local structure in the compound x=1 with its counterpart x=0, the XAFS results provide a direct evidence that Pr has replaced Y in the material. The nearest-neighbor structure in the CuO2 planes seems to remain intact as × varies from 0 to 1, indicating that substitution of Pr for Y does not disturb the local distribution of holes in the CuO2 planes. We suggest that local disorder and distortions in the second-neighbor bonding configuration could be responsible for suppression of superconductivity with increasing Pr content in the system.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

1. See, for example, Neumeier, J.J., Bjørnholm, T., Maple, M.B., and Schuller, I.K., Phys. Rev. Lett. 63, 2516 (1989), and references therein.Google Scholar
2. Abrikosov, A.A. and Gor'kov, L.P., Sov. Phys. JETP 12, 1243 (1961).Google Scholar
3. Fink, J., Nücker, N., Romberg, H., Alexander, M., Maple, M.B., Neumeier, J.J., and Allen, J.W., preprint.Google Scholar
4. Yang, I.S., Schrott, A.G., and Tsuei, C.C., preprint.Google Scholar
5. Lee, P.A., Citrin, P. H., Eisenberger, P. and Kinkaid, B. M., Rev. Mod. Phys. 53, 769 (1981).CrossRefGoogle Scholar
5a. Hayes, T. M. and Boyce, J. B., in “Solid State Physics” edited by Ehrenreich, E., Seitz, F., and Turnbull, D., Vol 37, p. 173 (Academic Press, New York, 1982).Google Scholar
5b. Stern, E. A. and Heald, S. M. in Handbook on Synchrotron Radiation, edited by Koch, E. E., Vol. 1, p. 955 (Nort-Holland, New York, 1983).Google Scholar
5c. “X-ray Absorption”, edited by Koningsberger, D.C. and Prins, R. (Wiley, New York, 1988).Google Scholar
5d. Proceedings of the Fifth International Conference on X-ray Absorption Fine Structure, edited by de Leon, J. M., Stern, E. A., Sayers, D. E., Ma, Y., and Rehr, J. J. [Physica B158 (1989)].Google Scholar
5e. Teo, B.K. and Joy, D. C. “EXAFS Spectroscopy, Techniques and Applications” (Plenum Press, New York, 1981).CrossRefGoogle Scholar
6. Smith, G. C., Krol, A., and Kao, Y. H., Nucl. Instr. Meth. A291, 135 (1990).Google Scholar