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Soft X-Ray Emission Studies of the Electronic Structure in Silicon Nanoclusters
Published online by Cambridge University Press: 15 February 2011
Abstract
Density of states changes in the valence and conduction band of silicon nanoclusters were monitored using soft x-ray emission and absorption spectroscopy as a function of cluster size. A progressive increase in the valence band edge toward lower energy is found for clusters with decreasing diameters. A similar but smaller shift is observed in the near-edge x-ray absorption data of the silicon nanoclusters.
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- Copyright © Materials Research Society 1997
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