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Stability Diagrams for Epitaxial Strained Layers

Published online by Cambridge University Press:  25 February 2011

J. Y. Tsao ,
B. W. Dodson  and
S. T. Picraux
J. Y. Tsao
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
B. W. Dodson
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
S. T. Picraux
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
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Abstract

For bulk materials, plastic deformation mechanisms and rates depend in a complex way on resolved shear stress and temperature, but can be succinctly described using the deformation mechanism maps pioneered by Ashby and Frost [1]. In this paper, we describe the use of such maps to demarcate the various stability and metastability regimes of single and multilayered strained epitaxial structures, and to interpret experimental work in the SiGe system.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 103 , 1987 , 153
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

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