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Strain and Interdiffusion Profiles in Epitaxied AU/NI (100) Multilayers Deduced From X-Ray Diffraction Experiments
Published online by Cambridge University Press: 21 February 2011
Abstract
Au(100)/Ni(100) periodic superlattices have been grown by the MBE technique specially for X-ray diffraction experiments. The nominal number of Ni planes deposited were 1.5, 2, 4 and 5 ML and the thickness of the gold layers was always 1.5 nm. The X-ray profiles have been simulated using a kinematical structure refinement program. The obtained strain profiles are in very good agreement with earlier HREM results. It is shown that a strong interdiffusion occurs during the growth.
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- Research Article
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- Copyright © Materials Research Society 1995
References
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