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A Structural Analysis Method for Graphite Intercalation Compounds

Published online by Cambridge University Press:  18 March 2011

Tatsuo Nakazawa
Affiliation:
Nagano National College of Technology, 716 Tokuma, Nagano-shi, 381-8550, JAPAN
Kyoichi Oshida
Affiliation:
Nagano National College of Technology, 716 Tokuma, Nagano-shi, 381-8550, JAPAN
Takashi Miyazaki
Affiliation:
Nagano National College of Technology, 716 Tokuma, Nagano-shi, 381-8550, JAPAN
Morinobu Endo
Affiliation:
Shinshu University, 4-17-1 Wakasato, Nagano-shi, 380-8553, JAPAN
Mildred S. Dresselhaus
Affiliation:
Currently on leave from the Massachusetts Institute of Technology, Cambridge, MA 02139, USA
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Abstract

Study of the microstructure of electronic materials can be enhanced by using high resolution transmission electron microscopy (TEM) combined with the technique of digitized image analysis. We show here a practical image analysis method for the microstructures of acceptor graphite intercalation compounds (GICs) with CuCl2 and FeCl3 intercalates. The two dimensional fast Fourier transform (2D-FFT) was used for the frequency analysis of the TEM pictures. It is found that the lattice images of CuCl2-GICs consist of different frequency images corresponding to specific frequencies. The detailed features of the stage-1 structure of the FeCl3-GICs is extracted quantitatively by this method from a relatively indistinct TEM picture. The stage structure of the CuCl2- and FeCl3-GICs are further investigated by analyzing the reconstruction of the TEM images by means of the two dimensional inverse FFT (2D-IFFT).

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

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