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Structural Characterization of Pt/Co Multilayers for Magnetooptic Recording Using X-Ray Diffraction

Published online by Cambridge University Press:  03 September 2012

James A. Bain ,
Bruce M. Clemens  and
Sean Brennan
James A. Bain
Affiliation:
Dept. of Materials Science and Engineering, Stanford University, Stanford CA, 94305–2205
Bruce M. Clemens
Affiliation:
Dept. of Materials Science and Engineering, Stanford University, Stanford CA, 94305–2205
Sean Brennan
Affiliation:
Stanford Synchrotron Radiation Lab, Stanford, CA 94309
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Abstract

Structural features in magnetic multilayer films such as interfacial sharpness and in-plane stress are regarded as responsible for the perpendicular magnetic anisotropy observed in these films. The Multilayers often consist of alternating magnetic and non-Magnetic layers, and the degree of interfacial sharpness between the two is a critical component in producing perpendicular anisotropy. Additionally, in-plane stress affects the anisotropy through Magnetostriction. In this work, we measure both the composition modulation and the stress in multilayers of Pt/CO with x-ray diffraction. Quantitative information about the composition modulation is extracted by recursively fitting a model of multilayer diffraction to the high angle superlattice lines. The Model incorporates a composition modulation of variable amplitude, along with a statistical description of the layer thickness fluctuations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 313: Symposium Q1 – Magnetic Ultrathin Films, Multilayers and Surfaces/Magnetic Interfaces-Physics and Characterizations , 1993 , 799
Copyright
Copyright © Materials Research Society 1993

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References

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