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Structure Imaging and Defects in Crystallized Oxynitride Glasses
Published online by Cambridge University Press: 26 February 2011
Abstract
High resolution electron microscopy has been employed to elucidate fault defects and structural details of the δ1 and δ2-Y2Si2O7 crystalline phases. From this study δ1 and δ2-Y2Si2O7 have been found to be orthorhombic having the same cell parameters but different atomic arrangements due to a change in their space groups. Computer simulations were necessary for interpreting details from the high resolution electron micrographs.
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- Copyright © Materials Research Society 1987
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