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Studying Structure of Metallic Superlattices by "Symmetric" and "Asymmetric" X-rAY Diffraction
Published online by Cambridge University Press: 15 February 2011
Abstract
"Symmetric" and "asymmetric" x-ray diffraction measurements are proposed as a tool for quantitative and complete determination of the superlattice structure. A general procedure which takes into account the atomic structure of the sublayers as well as structural disorder are presented. The "asymmetric" geometry using the "sin2psi" method is particularly emphasized.
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- Copyright © Materials Research Society 1993