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Submicron Particle Sizing by Light Scattering and Sedimentation

Published online by Cambridge University Press:  21 February 2011

Jenifer Taylor*
Affiliation:
New York State College of Ceramics at Alfred University, Alfred New York 14802
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Abstract

Submicron particle sizing is complex, requiring careful interpretation of distribution data. Information gathered from laboratory use of a sedimentometer and a light scattering system are discussed in terms of strengths and weaknesses.

Type
Research Article
Copyright
Copyright © Materials Research Society 1984

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References

REFERENCES

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4. Kaye, Brian H., Direct Characterization of Fine Particles (John Wiley & Sons, NY 1981).Google Scholar