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Surface Charge Grating in the Transverse Geometry Holographic Recording Thin Film Devices

Published online by Cambridge University Press:  10 February 2011

Qingnan Wang  and
Doyle A. Temple
Qingnan Wang
Affiliation:
Department of Physics, Hampton University, Hampton, VA 23668, wong@gprc.hamptonu.edu
Doyle A. Temple
Affiliation:
Department of Physics, Hampton University, Hampton, VA 23668, wong@gprc.hamptonu.edu
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Abstract

We have used a two-dimensional charge transport model to study edge effects in photorefractive thin films. Our result shows that in addition to the bulk space charges, the large surface charges near the edges make a significant contribution to the space charge field. Quadratic electro-optic material were used as an example to study the surface-charge-layer-field quantitatively. The conditions for the device performance be dominated by either surface charge or bulk trap charges are clearly demonstrated.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 450: Symposium O – Infrared Applications of Semiconductors , 1996 , 473
Copyright
Copyright © Materials Research Society 1997

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References

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