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Surface Temperatures and Dissociation Loss During the Pulsed Laser Annealing of GaAs

Published online by Cambridge University Press:  22 February 2011

John T.A. Pollock
Affiliation:
Csiro, Division of Chemical Physics, Lucas Heights Research Laboratories, NSW, 2232, Australia.
Alex Rose
Affiliation:
Csiro, Division of Chemical Physics, Lucas Heights Research Laboratories, NSW, 2232, Australia.
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Abstract

From reported equilibrium partial and total dissociation pressure data for GaAs and melt times derived from reported time resolved reflectivity experiments, estimates have been made of the anticipated rate of As loss. Good agreement was found with experimentally determined As loss. A similar approach using experimentally determined Ga loss data allowed estimates of the maximum temperatures reached during pulsed laser annealing. These temperatures are considerably higher than suggested in thermal modelling studies. The boiling point of Ga gould be exceeded at incident laser energies >0.8 J cm−2.

Type
Research Article
Copyright
Copyright © Materials Research Society 1984

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References

REFERENCES

(1)Williams, J.S. and Harrison, H.B., “Laser and Electron-Beam Solid Interactions and Materials Processing”, Eds. Gibbons, J.F., Hess, L.D. and Sigmon, T.W., North Holland, N.Y. (1981), p. 209 .Google Scholar
(2)anderson, C.L., “Laser and Electron-Beam Interactions with Solids”, Eds. Appleton, B.x. and Celler, G.K., Elsevier, N.Y., (1982), p.653.Google Scholar
(3)Cardona, H., “Semiconductors and Semimetals”, Eds.Willardson, R.K. and Beer, A.C., Vol. 3, Academic Press, N.Y., 1976.Google Scholar
(4)Wood, R.F., Lowndes, D.H. and Christie, W.H., ref. (1), p.231.Google Scholar
(5)Wang, Z.L. and Saris, F.W., Phys. lett. 83A (1981) 367.Google Scholar
(6)Boerma, D.O., Hasper, H. and Prasard, K.G., Phys. Lett. 92A (1983) 253.Google Scholar
(7)Aydinli, A., Compaan, A., Lo, H.W. and Lee, M.C., ibid86A (1981) 199.Google Scholar
(8)Rose, A., Pollock, J.T.A., Scott, M.D., Adams, F.M., Williams, J.S. and Lawson, E.K., “Laser and Electron Beam Processing”, Boston MRS 1982. To be published.Google Scholar
(9)de Jong, J., Wang, Z.L. and Saris, F.W., Phys. Lett. 90A (1982) 147.Google Scholar
(10)Richman, D., J. Phys. Chem. Soc., 24 (1963) 1131.Google Scholar
(11)Arthur, J.R., ibid 28 (1967) 2257.Google Scholar
(12)Venkatesan, T.N.C., Auston, D.H., Golouchenko, J.A. and Surko, C.M., Appl. Phys. Lett., 35 (1979) 88.Google Scholar
(13)Gamo, K., Yuba, Y., Oraby, A.H., Wurakami, K., Namba, S. and Kawaski, K., “Laser and Electron-Beam Processing of Materials”, Eds. White, C.W., Peercy, P.S., Academic Press, N.Y., 1980, p. 322.Google Scholar
(14)Foxon, C.T. and Joyce, B.A., Surf. Sci., 50 (1975) 434.Google Scholar
(15)Holland, L., “Vacuum Deposition of Thin Films”, Chapman and Hall, London, 1956.Google Scholar
(16) Seleted Values of the Thermodynamic Properties of the Elements”, American Society for Metals, 1976.Google Scholar
(17)Rosenblatt, G.M., “Treatise on Solid State Chemistry”, ed. Hannay, N.H., Plenum Press, 1978, V. 6A (1), p.165.Google Scholar
(18)Oron, M. and Sorensen, G., Appl. Phys. Lett., 35 (1979) 782.Google Scholar
(19)Fauchet, P.M. and Siegman, A.E., ibid, 40 (1982) 824.Google Scholar
(20)Rose, A. and Pollock, J.T.A., unpublished.Google Scholar
(21)Bakker, M. et al. to be published, see ref.9.Google Scholar
(22)Pospieszczyk, A., Harith, M.A. and Stritzker, B., J.Appl.Phys., 54 (1983) 3176.Google Scholar