Hostname: page-component-84b7d79bbc-2l2gl Total loading time: 0 Render date: 2024-07-29T13:26:46.226Z Has data issue: false hasContentIssue false
  • English
  • Français

TEM study of InSbTe crystal morphology as a function of crystallization conditions

Published online by Cambridge University Press:  01 February 2011

Marcel A. Verheijen ,
Andrei Mijiritskii  and
Bart J. Kooi
Marcel A. Verheijen
Affiliation:
Philips Centre for Industrial Technology, Eindhoven, the Netherlands
Andrei Mijiritskii
Affiliation:
Philips Centre for Industrial Technology, Eindhoven, the Netherlands
Bart J. Kooi
Affiliation:
University of Groningen, Groningen, the Netherlands
Get access

Abstract

In this work crystallization of an InSbTe alloy in Blu-ray Disc rewritable (BD-RE) media is studied using Transmission Electron Microscopy (TEM). Two different crystalline states can be formed in a thin InSbTe layer depending on crystallization conditions. These two states give rise to different reflectivity levels of the recording stack as well as a different level of normalized media noise. It is shown that the two states correspond to the same phase (R 3 m), but that they show clear differences in morphology as well as in texture.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 803: Symposia GG/HH – Advanced Characterization Techniques for Data Storage Materials – Phase Change and Nonmagnetic Materials for Data Storage , 2003 , HH3.5
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Iwasaki, H., Harigaya, M., Nonoyama, O., Kageyama, Y., Takahashi, M., Yamada, K., Deguchi, H., Ide, Y., Jap. J. Appl. Phys. 32 (1993), 5241.Google Scholar
2. Friedrich, , Weidenhof, V., Njoroge, W., Franz, P., Wuttig, M., J. Appl. Phys. 87 (2000), 4130.Google Scholar
3. Kaiser, M., van Pieterson, L. and Verheijen, M.A.. J. Appl. Phys. (submitted).Google Scholar