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Temperature Dependence of the Electrical Resistivity of Polymerized C60 Thin Films

Published online by Cambridge University Press:  11 February 2011

R. Govinthasamy ,
J. H. Rhee  and
S. C Sharma
R. Govinthasamy
Affiliation:
Department of Physics, The University of Texas at Arlington, Arlington, TX 76019, USA
J. H. Rhee
Affiliation:
Department of Physics, The University of Texas at Arlington, Arlington, TX 76019, USA
S. C Sharma*
Affiliation:
Department of Physics, The University of Texas at Arlington, Arlington, TX 76019, USA
*
*sharma@uta.edu
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Abstract

Highly conducting thin films of C60 were deposited by thermal evaporation in high vacuum on single crystal silicon substrates. The microstructure of the films was characterized by using Atomic Force Microscopy, and laser Raman spectroscopy. The films were polymerized by uv irradiation. The dc electrical resistivities of the as-deposited and uv-polymerized films were measured as functions of temperature between 295 and 17K by the four-probe technique. We present results on the effects of uv-irradiation on the surface microstructure and the temperature dependence of the electrical resistivity of these films.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 734: Symposia A/B – Defect-Mediated Phenomena in Ordered Polymers – Polymer/Metal Interfaces and Defect Mediated Phenomena in Ordered Polymers , 2002 , B9.30
Copyright
Copyright © Materials Research Society 2003

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References

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