Hostname: page-component-7479d7b7d-m9pkr Total loading time: 0 Render date: 2024-07-13T15:52:41.281Z Has data issue: false hasContentIssue false
  • English
  • Français

Tetragonal Au-Ni (001) Solid Solutions Grown by MBE

Published online by Cambridge University Press:  21 February 2011

A. Marty ,
M. Dynna ,
B. Gilles ,
G. Patrat  and
A. Chamberod
A. Marty
Affiliation:
CEA/Département de Recherche Fondamentale sur la Matière Condensée SP2M/MP, 38054 Grenoble Cedex 9, France.
M. Dynna
Affiliation:
CEA/Département de Recherche Fondamentale sur la Matière Condensée SP2M/MP, 38054 Grenoble Cedex 9, France.
B. Gilles
Affiliation:
LTPCM, ENSEEG, BP 75, 38402 Saint Martin d'Hères, France.
G. Patrat
Affiliation:
Laboratoire de Cristallographie, CNRS, BP166, 38042 Grenoble Cedex 9, France.
A. Chamberod
Affiliation:
CEA/Département de Recherche Fondamentale sur la Matière Condensée SP2M/MP, 38054 Grenoble Cedex 9, France.
Get access

Abstract

A study has been made of metastable Au-Ni thin films codeposited by MBE on Au(001). The in-plane relaxation of the deposit was measured with RHEED during growth and the tetragonality of the whole Au-Ni layer was measured with non-symmetric X-ray scans and GDCD. Plan view and cross-sectional TEM show that the alloys relax via twinning on {111} planes. In addition, diffraction patterns show the presence of diffuse rings about points in the reciprocal lattice associated with the Lio structure. These are attributed to the presence of an antiphase structure which forms in response to the very high stresses in the Au-Ni layer. An Lio phase having a high degree of order has been grown by alternating single Au and Ni atomic layers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 355: Symposium B1 – Evolution of Thin-Film and Surface Structure and Morphology , 1994 , 169
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Cahn, J.W. and Larche, F., Acta metall. 32, 1915 (1984).Google Scholar
2. Chiang, C.S. and Johnson, W.C., J. Mater. Res. 4, 678 (1989).Google Scholar
3. Sanadze, V.V. and Gulyeav, G.V., Soviet Physics-Cry stall. 4, 496, 646 (1960).Google Scholar
4. Khan, I.H. and Francombe, M.H., J. Appl. Phys. 36, 1699 (1965).Google Scholar
5. Marty, A., Gilles, B., Eymery, J., Chambered, A. and Joud, J.C., Mater. Res. Soc. Proc. 237, 511 (1992).Google Scholar
6. Glossop, A.B. and Pashley, D.W., Proc. Roy. Soc. A 250, 132 (1959).Google Scholar
7. Miida, R., Tanaka, M., Arashi, H., and Ishigame, M., J. Appl. Cryst. 27, 67 (1994).Google Scholar