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Texture by the kilometer
Published online by Cambridge University Press: 18 March 2011
Abstract
A novel x-ray diffractometer has been used to characterize the texture of 2 km of textured tape in segments up to 20 m long. Techniques have been developed for the study of the uniformity of texture and for the detection of second phases, deviations from cube texture, and the sharpness of cube texture, in metal substrates, oxide buffer layers, and YBa2Cu3O7 (YBCO) superconductors.
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- Copyright © Materials Research Society 2002