Article contents
Time Resolved Tem of Laser-Induced Phase Transitions in a-Ce And a-Si/Al-Films
Published online by Cambridge University Press: 28 February 2011
Abstract
This paper presents an improved new method for studying the dynamics of laser induced phase transitions down to the submicron-nanosecond scale by means of a modified commercial Transmission Electron Microscope (TEM) /1/. Results on Pulsed Laser Annealing (PLA) of amorphous Germanium and a-Si/Al films are described. Potential applications and limits of this method are briefly discussed.
- Type
- Articles
- Information
- Copyright
- Copyright © Materials Research Society 1986
References
- 5
- Cited by