Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
DROWLEY, C.I.
1993.
Characterization in Silicon Processing.
p.
1.
Kamiński, Paweł
Kozłowski, Roman
Żelazko, Jarosław
and
Wodzyński, Maciej
2018.
Iron-related deep electron traps in epitaxial silicon resolved by Laplace-transform deep level transient spectroscopy.
Semiconductor Science and Technology,
Vol. 33,
Issue. 11,
p.
115013.
Sasaki, Shun
Mitsugi, Noritomo
Samata, Shuichi
Manabe, Wataru
Gollapudi, Srikanth
Tsukuda, Masanori
and
Omura, Ichiro
2023.
New equations to calculate carrier recombination lifetime of silicon epitaxial layer, based on open circuit voltage decay method.
Japanese Journal of Applied Physics,
Vol. 62,
Issue. 11,
p.
111001.