No CrossRef data available.
Article contents
Transmission Electron Microscope Observations of Lattice Defects Produced During Diffusion Induced Grain Boundary Migration
Published online by Cambridge University Press: 26 February 2011
Abstract
In a TEM study of diffusion induced grain boundary migration (DIGM) we have found that it is very common for lattice defects to be ejected into the grains adjoining a migrating boundary. The defects may be point defects or dislocations, or both. Dislocation ejection occurs both ahead of and behind moving boundaries, but vacancy deposition appears to occur only behind a moving boundary.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 1988