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VUV Synchrotron Light as a Technique for Studying the Interface Quality and Properties of Thin Overlayers
Published online by Cambridge University Press: 25 February 2011
Abstract
The measurements presented here show the value of synchrotron light for determining both the electronic structure of overlayers, and the physical nature of the overlayer-substrate interface. A comparison is given between deposited layers and thermally stabilized layers. Estimates are also made of the bonding energy between the overlayer and substrate.
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- Copyright © Materials Research Society 1985