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X-Ray Diffraction Applied to the Study of Defects in Surfaces

Published online by Cambridge University Press:  25 February 2011

I. K. Robinson  and
K. L. D'amico
I. K. Robinson
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
K. L. D'amico
Affiliation:
Physics Department, Brookhaven National Laboratory Upton, New York 11973
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Abstract

The role of x-ray diffraction in characterising defects in crystals is reviewed briefly. It is most sensitive to the presence of plane defects which destroy the long-range order. The same argument is shown to apply to line defects in surface structures. Two recent glancing incidence x-ray diffraction experiments provide contrasting examples: randomly distributed steps are found in the Au(110) reconstructed surface, while regular arrays of domain walls modify certain phases of krypton monolayers physisorbed on graphite substrates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 41: Symposium K – Advanced Photon and Particle Techniques for the Characterization of Defects in Solids , 1984 , 161
Copyright
Copyright © Materials Research Society 1985

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References

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