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X-Ray Reflectivity and Fluorescence Measurements From Polystyrene-Co-Bromostyrene/Polystyrene Interfaces
Published online by Cambridge University Press: 22 February 2011
Abstract
X-ray fluorescence using synchrotron radiation at glancing angles of incidence was used to measure interface widths for the highly immiscible polymer blend system polystyrene/polybromostyrene (PS/PBrxS, with bromination level x = 0.8 bromine atoms per monomer). The interfacial widths are for bilayers annealed for 4 hours and 24 hours at 141±1C are found to be 100± 20Å and 110±20Å respectively.
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