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Atomic Force Microscopy Studies of Fracture Surfaces From Oxide / Polymer Interfaces

Published online by Cambridge University Press:  21 March 2011

Maura Jenkins ,
Jeffrey Snodgrass ,
Aaron Chesterman ,
Reinhold H. Dauskardt  and
John C. Bravman
Maura Jenkins
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, U.S.A
Jeffrey Snodgrass
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, U.S.A
Aaron Chesterman
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, U.S.A
Reinhold H. Dauskardt
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, U.S.A
John C. Bravman
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, U.S.A
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Abstract

Atomic Force Microscopy (AFM) is used to characterize fracture surfaces in silicon oxide / silane adhesion promoter / BCB polymer systems. Fatigue striations were found on some samples, and these were correlated with the crack growth rate per fatigue cycle. X-ray Photoelectron Spectroscopy (XPS) was used to identify the species present on each surface, and it was found that striations only form when the fracture path is through the polymer.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 654: Symposia AA – Structure-Property Relationships of Oxide Surfaces & Interfaces , 2000 , AA2.7.1
Copyright
Copyright © Materials Research Society 2001

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