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Complete k-Space Visualization Of X-Ray Photoelectron Diffraction

Published online by Cambridge University Press:  15 February 2011

J. D. Denlinger ,
Eli Rotenberg ,
S. D. Kevan  and
B. P. Tonner
J. D. Denlinger
Affiliation:
Department of Physics, University of Wisconsin-Milwaukee, Milwaukee, WI 53211 Advanced Light Source, Lawrence Berkeley Laboratory, Berkeley, CA 94720
Eli Rotenberg
Affiliation:
Department of Physics, University of Oregon, Eugene OR 97403
S. D. Kevan
Affiliation:
Department of Physics, University of Oregon, Eugene OR 97403
B. P. Tonner
Affiliation:
Department of Physics, University of Wisconsin-Milwaukee, Milwaukee, WI 53211
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Abstract

A highly detailed x-ray photoelectron diffraction data set has been acquired for crystalline Cu(001). The data set for bulk Cu 3p emission encompasses a large k-space volume (k=3–10 Å-1) with sufficient energy and angular sampling to monitor the continuous variation of diffraction intensities. The evolution of back-scattered intensity oscillations is visualized by energy and angular slices of this ‘volume’ data set. Large diffractyyion data sets such as this will provide rigorous experimental tests of real-space reconstruction algorithms and multiple-scattering simulations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 437: Symposium DD – Applications of Synchrotron Radiation to III , 1996 , 3
Copyright
Copyright © Materials Research Society 1996

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References

1 Barton, J. J., Phys. Rev. Lett. 67, 3106 (1991).Google Scholar
2 Tong, S. Y., Huang, H., and Wei, C. M., Phys. Rev B 46 2452 (1992).Google Scholar
3 Wu, H., Lapeyre, G. J., Huang, H. and Tong, S. Y., Phys. Rev Lett. 42, 251 (1993).Google Scholar
4 Naumovic, D., Stuck, A., Greber, T., Osterwalder, J., and Schlapbach, L., Phys. Rev. B 47, 7462 (1993).Google Scholar
5 Harp, G. R., Saldin, D. K., and Tonner, B. P., Phys. Rev B 42, 9199 (1990).Google Scholar
6 Terminello, L. J., Barton, J. J. and Lapiano-Smith, D. A., Phys. Rev. Lett. 70, 599 (1993).Google Scholar
7 Len, P. M., Thevuthasan, S., Kaduwela, A. P., Hove, M. A. Van, and Fadley, C. S., Surface Science, in press.Google Scholar
8 Terminello, L. J. and Barton, J. J., Phys. Rev. B. 47, 6851 (1993).Google Scholar
9 Denlinger, J., Rotenberg, Eli, Kevan, S. D. and Tonner, B. P. (unpublished).Google Scholar
10 Warwick, T., Heimann, P., Mossessian, D., Mckinney, W., and Padmore, H., Rev. Sci. Instrum. 66, 2037 (1995).Google Scholar
11 Denlinger, J. D., et. al, Rev. Sci. Instrum. 66, 1342 (1995).Google Scholar
12 Denlinger, J. D., Zhang, J. and Tonner, B. P., Nucl. Instr. Methods A 347, 475 (1994).Google Scholar
13 Orders, P.J. and Fadley, C. S., Phys. Rev. B 27, 6526 (1983).Google Scholar