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Condenser-Transducer Configuration for Improving Radiation Efficiency of Near-Field Optical Transducers

Published online by Cambridge University Press:  01 February 2011

Kursat Sendur
Affiliation:
Seagate Technology Research Center 1251 Waterfront Place Pittsburgh, PA 15222, U.S.A.
Chubing Peng
Affiliation:
Seagate Technology Research Center 1251 Waterfront Place Pittsburgh, PA 15222, U.S.A.
William Challener
Affiliation:
Seagate Technology Research Center 1251 Waterfront Place Pittsburgh, PA 15222, U.S.A.
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Abstract

Near-field radiation efficiency of the ridge waveguide transducer is investigated in the vicinity of a recording magnetic medium. Near-field radiation from a ridge waveguide transducer is expressed in terms of power density quantities. This allows us to quantify the near-field radiation efficiency from the near-field transducer with respect to the input optical power. Finite element method (FEM), which is capable of modeling focused beams, is used to simulate various geometries involving ridge waveguides. The incident electric field near the focal region is determined using a Gaussian beam expression and Richards-Wolf vector field equations for low NA and high NA beams, respectively. First, the ridge waveguide transducer is placed at the focal point of an optical lens system. The maximum value of the absorbed optical power in the recording medium is 1.6*10-4 mW/nm3 for a 100 mW input optical power. Finally, the ridge waveguide is placed adjacent to a solid immersion lens but separated by a low-index dielectric layer. For this case, the maximum value of the absorbed optical power in the recording medium is 7.5*10-4 mW/nm3 for a 100 mW input optical power. The improvement in the transmission efficiency is a result of two factors: 1. Increased incident electric field over the transducer surface due to increased NA of the optical system, 2. Surface plasmon enhancement obtained by placing a low-index dielectric material between the solid immersion lens and ridge waveguide.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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