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Correlation Between Bulk Morphology and Luminescence in Porous Silicon Investigated by Evaporation Induced Pore Collapse
Published online by Cambridge University Press: 17 March 2011
Abstract
We use a combination of scanning electron microscopy, laser scanning confocal microscopy and luminescence spectroscopy to correlate the emission properties of anodized porous silicon (PS) with film morphology in samples that have undergone evaporation induced collapse of the underlying porous structure. Several PS samples were investigated as a function of the current density (J) and total etch time, while the total charge (Q) injected per unit area (and the total Si removed) was kept constant during etching. From this data two classes of PS samples emerge. Porous silicon samples produced at high current density have a 3-dimensional pore network with a narrow distribution of blue-green emitting chromophores. In contrast, low current density samples form a 2-dimensional pore network normal to the Si substrate with larger chromophores and exhibit broad red luminescence.
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- Copyright © Materials Research Society 2001