Hostname: page-component-5c6d5d7d68-pkt8n Total loading time: 0 Render date: 2024-08-12T23:39:58.205Z Has data issue: false hasContentIssue false
  • English
  • Français

Surface Analysis of UO2 Leached in Mineral Water Studied by X-Ray Photoelectron Spectroscopy

Published online by Cambridge University Press:  26 February 2011

M. P. Lahalle ,
J. C. Krupa ,
R. Guillaumont ,
M. Genet ,
G. C. Allen  and
N. R. Holmes
M. P. Lahalle
Affiliation:
Institut de Physique Nucléaire, 91406 Orsay cedex, France
J. C. Krupa
Affiliation:
Institut de Physique Nucléaire, 91406 Orsay cedex, France
R. Guillaumont
Affiliation:
Institut de Physique Nucléaire, 91406 Orsay cedex, France
M. Genet
Affiliation:
Institut de Physique Nucléaire, 91406 Orsay cedex, France
G. C. Allen
Affiliation:
Central Electricity Generating Board, Berkeley Nuclear Laboratories, Berkeley, Gloucestershire, GL1S 9PB, England
N. R. Holmes
Affiliation:
Central Electricity Generating Board, Berkeley Nuclear Laboratories, Berkeley, Gloucestershire, GL1S 9PB, England
Get access

Abstract

X-rays photoelectron spectroscopy (XPS) analysis has been carried out on uranium dioxide single crystals placed in both deionised or mineral water at 60 °C and 90 °C for a few months. The surface layer on the sample immersed in mineral water at 90 °C was sufficiently thick to mask the presence of uranium in the recorded XPS spectrum. Depth profiling experiments showed that the deposit was ∼ 100 nm in thickness and revealed the formation of a mixed magnesium-uranium oxide region between the bulk UO2 and the outer magnesium- rich layer. Analysis of the aqueous medium following immersion of the UO2 samples showed that the concentration of uranium released to the mineral water was 10 to 100 times lower than that in deionised water.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 127: Symposium BERLIN – Scientific Basis for Nuclear Waste Management XII , 1988 , 351
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Kertes, A.S. and Guillaumont, R., Nucl. Chem. Waste Manag. 5, 215 (1985)Google Scholar
2. Johnson, L.H., Shoesmith, D.W., Lunansky, G.E., Bailey, M.G. and Tremaine, P.R., Nucl. Technology 56, 238 (1982)CrossRefGoogle Scholar
3. Ollila, K., Nuclear Waste Commission of Finnish Power Companies, Report YJT – 86 – 28 (1986)Google Scholar
4. Allen, G.C. and Holmes, N.R., J. Chem. Soc. Dalton Trans. 3009 (1987)CrossRefGoogle Scholar
5. Mauchien, P., Inorg. Chim. Acta 94, 139–140 (1983)CrossRefGoogle Scholar
6. Allen, G.C., Tempest, P.A. and Tyler, J.W., J. Chem. Soc. Faraday Trans. 1 83, 925 (1987)Google Scholar
7. Allen, G.C., Tucker, P.M. and Lewis, R.A., J. Chem. Soc. Faraday Trans. 2 80, 991 (1984)CrossRefGoogle Scholar
8. Allen, G.C., Griffiths, A.J. and Lee, B.J., Transition Met. Chem. 3, 229 (1978)Google Scholar
9. Sunder, S., Shoesmith, D.W., Mclntyre, N.S., Bailey, M.G. and Stanchell, F.W., J. Elec-troanal. Chem. 130, 163 (1981)Google Scholar
10. Sunder, S., Shoesmith, D.W., Bailey, M.G. and Wallace, G.J., J. Electroanal. Chem. 150, 217 (1983)Google Scholar
11. Nicol, M.J. and Needes, C.R.S., Electrochim. Acta 20, 585 (1975)CrossRefGoogle Scholar
12. Shoesmith, D.W., Sunder, S., Bailey, M.G. and Owen, D.G. in Passivity of Metals and Semiconductors edited by Froment, M. (Elsevier Science Publishers B.V., Amsterdam, 1983)Google Scholar
13. Allen, G.C. and Tempest, P.A., Proc. R. Soc. London Ser. A 406, 325 (1986)Google Scholar