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Effect of Pile-up in Nanoindentation of Micro and Nano crystalline Ni using FEM

Published online by Cambridge University Press:  01 February 2011

Raja Mahesh Pothapragada
Affiliation:
University of North Texas, Denton, Texas 76203
Reza A. Mirshams
Affiliation:
University of North Texas, Denton, Texas 76203
Suman Vadlakonda
Affiliation:
University of North Texas, Denton, Texas 76203
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Abstract

A much better understanding of the contact mechanics can be obtained through finite element modeling. The experimentally determined tip shape function was included to reproduce the same contact area for a given contact depth as in the experiment. The fundamental material properties affecting pile-up are the ratio of the effective modulus to yield stress Eeff/Y and the work hardening rate.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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References

1 Xiaodong, L., Bharat, B., A Review of Nanoindentation Continuous Stiffness Measurement Technique and Its Applications, Materials Characterization 48, 11(2002)Google Scholar
2 Hay, J. L., Pharr, G. M., Instrumented Indentation Testing, ASM Hand book, vol. 8.Google Scholar
3 Oliver, W.C., Parr, G.M., J.Mater.Reqs. 7 (1992) 1564 Google Scholar
4 Pharr, G.M., Mater,mater.Sci.Eng A 253 (1998) 151 Google Scholar
5 Saha, R., Xue, Z., Huang, Y., Nix, W.D., J.Mech.Phys.Solids 49 (2001) 1997 Google Scholar
6 Mirshams, R.A., R-Curve characterization of the fracture toughness of nanocrystalline nickel thin films, Material science and engineering A315(2001)2127 Google Scholar
7 Oliver, W.C., in Measurement of hardness and elastic modulus by instrumented indentation J.Mater.Res., vol.19, No. 1, Jan 2004 Google Scholar
8 Pethica, J.B. and Oliver, W.C., J.Mater.Res. 5, 123 (1990).Google Scholar
9 Joslin, D.L. and Oliver, W.C., J.Meter.Res. 5, 123(1990)Google Scholar
10 Fischer-Cripps, C., Nanoindentation, New York, Springer (2002) P.19.Google Scholar
11 Nano SP1, MTS (Knoxville)Google Scholar
12 Bolshakov, A., Oliver, W.C., Pharr, G.M., Mater.Res.Soc.Symp.Proc. 436 (1997) 141 Google Scholar
13 Poole, W.j., Ashby, M.F., Fleck, N.A., Scirpta Mater. 34 (1996) 559 Google Scholar
14 yu, Ning, Polycarpou, Andreas A., “Tip-radius effect in finite element modeling of sub-50 nm shallow nanoindentation”, Thin Solid Films in Press, 2003 Google Scholar
15 Pothapragada, Raja Mahesh, FEM of nanoindentation on Micro and Nano crystalline Ni: Analysis of Factors Affecting Hardness and Modulus values, University of North Texas, MS Thesis (2005)Google Scholar