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Electrooptic Properties of Pzt thin Films for Image Storage Applications

Published online by Cambridge University Press:  25 February 2011

D. Dimos  and
R.W. Schwartz
D. Dimos
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
R.W. Schwartz
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
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Abstract

The photocurrent responses, photo-induced changes in hysteresis behavior, and electrooptic (birefringence) effects of sol-gel derived PZT films have been characterized as part of an effort to evaluate ferroelectric films for image storage and processing applications.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 243: Symposium G – Ferroelectric Thin Films II , 1991 , 73
Copyright
Copyright © Materials Research Society 1992

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References

1. Land, C.E., Thacher, P.D., and Haertling, G.H., in Applied Solid State Science, edited by Wolfe, R., (Academic Press, New York, 1974), p. 137.Google Scholar
2. Land, C.E. and Peercy, P.S., Ferroelectrics, 45, 25 (1982).Google Scholar
3. Schwartz, R.W., Bunker, B.C., Dimos, D., Assink, R.A., Tuttle, B.A., Tallant, D.R., and Weinstock, I.A., Ferroelectrics (1992), in press.Google Scholar
4. Dimos, D., Land, C.E., and Schwartz, R.W., Ceramic Transactions (Proceedings of the Ferroelectrics Symposium, ACers Annual Meeting, 1991), in press.Google Scholar
5. Land, C.E. and Peercy, P.S., Ferroelectrics, 22, 677 (1978).Google Scholar
6. Seager, C.H. and Land, C.E., Appl. Phys. Lett., 45, 395 (1984).Google Scholar
7. Butler, M.A., Martin, S.J., and Land, C.E., Appl. Optics, 28, 5105 (1989).Google Scholar
8. Adachi, H., Kawaguchi, T., Setsune, K., Ohji, K., and Wasa, K., Appl. Phys. Lett., 42, 867 (1983).Google Scholar