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Impact of Erbium-Doped Silicon Nanocrystals on the Properties of Polyphenylene Vinylene Films
Published online by Cambridge University Press: 17 March 2011
Abstract
This work describes our initial studies of Er-doped Si nanocrystal/poly(phenylene vinylene) (PPV) composites. Preliminary results have focused on the characterization of these materials via atomic force microscopy (AFM), profilometry, absorption/fluorescence spectroscopies, and current-voltage measurements. A particular point of emphasis here concerns the influence of the Er-doped Si nanocrystals on PPV photoluminescence and carrier transport.
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- Copyright © Materials Research Society 2001