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Instrumental Limitations and Current Prospects for Materials Research with the Latest Generation of High-Resolution Electron Microscopes

Published online by Cambridge University Press:  25 February 2011

David J. Smith
David J. Smith*
Affiliation:
High Resolution Electron Microscope, Department of Metallurgy and Materials Science, University of Cambridge, CB2 3RQ, U.K.
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Extract

The macroscopic properties of most materials depend directly on their microstructure and its local variability at the atomic level. Recent trends in high resolution electron microscopes (HREMs) have led to resolving powers on this scale, which in turn has made these instruments invaluable to many materials science investigations. The purposes of this short review are firstly to outline some of the fundamentals of high resolution image formation and interpretation and then to summarise some of the latest instrumental developments. Some recent applications are briefly described to provide some appreciation of the wide range of materials currently being investigated with the HREM. The impact of this work should be apparent from reference to other papers in this volume as well as several recent reviews [1–3] and special conference proceedings [4–5]. The likelihood of further developments in instrumentation and the necessity for complementary information from other techniques are also briefly considered.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 41: Symposium K – Advanced Photon and Particle Techniques for the Characterization of Defects in Solids , 1984 , 3
Copyright
Copyright © Materials Research Society 1985

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